Design for Testability (DFT)

Domain specific testing methodologies helps to cater to the needs of different verticals with specialized hardware, tools and platforms

Rising complexity of the designs and issues in debugging the manufacturing faults, DFT logic plays a vital role in ASIC chips. At the same time building a test logic with optimal compression architectures has also become critical to save the tester time.

Skandysys has a strong DFT team with a track record of successful DFT execution using different DFT toolsets including Tessent, Mentor and Cadence toolsets.

DFT Services

DFT Planning, Architecture, Flow and Methodology Development.
DFT Implementation which includes User Defined Registers (UDR) definitions for better controllability, Test Pin-Muxing, SCAN Insertion, LBIST Insertion, Compression Logic Insertion, Boundary Scan Insertion, Memory BIST insertion and IOs.
Automatic Test Pattern Generation (ATPG), ATPG verification.
DFT simulations for zero delay and timing for SCAN, Boundary SCAN, MBIST & LBIST modes.
Pre-silicon and Post-silicon Debug.
ATE Test Program development and Production support.
ATE Hardware development and packaging

To achieve your silicon dreams, we at SkandySys strive to bring the best solution tailored to suit your business. Experience the least turn-around-time with us from design to finish. Our first silicon success, two tape-outs, and successful completion of two turnkey projects speak volumes for us.

We add intelligence to things

Grow your business with technology futurists and visionaries
who have the proven mantra for first silicon pass and tape-outs at the very small turn around time.

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